Open-Circuit Voltage Decay System
This system performs open circuit voltage decay analysis on packaged PN junction devices for use with injection-dependent lifetime spectroscopy techniques. The system injects currents that can range from ~ 1 mA to 100 A in a pulsed manner through an electronically controlled, fast, nearly ideal switch to disconnect the device being analyzed. Data is acquired and uploaded to a custom program that automates much of the analysis required for carrier lifetime spectroscopy.
Block diagram:
Physical system:
