Narrow-Pulse Test Bed for Evaluation of Experimental Wide Bandgap Semiconductor Devices
This system performs automated high-energy repetitive stress-cycling of experimental semiconductor devices, recording all pertinent waveforms with built-in, high frequency data acquisition and alternates device characterization at chosen intervals via a bult-in, high voltage, high current curve tracer, switching between the two sets of circuitries with a custom-designed 3-pole, 3-throw electromechanical switch.
Block diagrams:
Physical system:
