Aerospace Medical Association Conference 2025

BSI attended the Aerospace Medical Association (AsMA) Conference 2025 in Atlanta, Georgia to showcase our Sensor Integration Block (SIB) and continue collaboration with AeroClenz.

BSI booth at AsMA 2025

Assembled kit

At the Aerospace Medical Association Conference in Atlanta, Georgia, BSI had the exciting opportunity to engage with industry leaders and experts while showcasing our innovative Sensor Integration Block, designed to enhance safety and performance in aerospace medicine. This dynamic event allowed us to connect with like-minded professionals and explore collaborative efforts with AeroClenz, all while sharing insights on the latest advancements in technology and research. We are proud to be part of a community that prioritizes the well-being of those who fly and work in demanding environments, and we look forward to fostering these relationships as we continue to push the boundaries of innovation in aerospace health solutions.

Alpha particles striking CR-39 through large aperture

CR-39 after 7 day contact exposure and subsequent developing etch.

50x optical microscope image of CR-39 exposed for 7 days at 0.6"

Optical microscope image of 7 day exposure at 0.6″ distance.

Option 1: BSI will provide you with a development kit for $599.00 to chemically process your CR-39 particle track detectors. You will need to separately purchase your own sodium hydroxide, and to follow the heating instructions carefully using the hot plate that we provide while following our safety instructions carefully.

Option 2: BSI will sell you a reconditioned optical microscope with an ocular camera and a computer interface for $1,299. This includes the cost of a new lap-top, loaded with the imaging and image analysis software that you will need to understand your results. Please see the image of this DIY system, below. Please note that that the actual reconditioned optical microscope may vary, but it will be fully adequate to support your DIY activities. This system will be able to assist the user by counting the number of tracks in a reference area. For an additional price, BSI can provide advanced AI-based analysis tools which differentiate between different particle tracks, particle arrival angles, and particle energies, and to provide displays showing the distribution of these traits within the observed particle tracks. Please contact BSI if you would like us to work with you to develop custom analysis software for your specific research applications.

Click here for more information for best practice for the use of CR-39.

Click here for electron microscope web application image. This image is of our CR-39 exposed to Am-241 alpha particles. Notice the direction of impact and depth of penetration. Here is the same image with AI labeling of features.