Wide Bandgap Avalanche Energy Test Bed
Custom electronic testbed utilized for the evaluation of avalanche energy tolerance of wide bandgap semiconductors. A modular design approach was utilized to allow for a wide variety of control conditions to be implemented in addition to varying package topologies. An important design aspect implemented was precise energy control allowing the failure mode to be analyzed post destructive failure. Both commercial and research grade Silicon Carbide (SiC) MOSFETs were evaluated.
